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Category SearchProceedings of the Satellite symposium to ESSDERC 95, the Hague, the Netherlands ALTECH 95--analytical techniques for semiconductor materials and process characterization II edited by Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer ; Electronics and Dielectric Science and Technology Divisions [Electrochemical Society, Inc.]
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Copyright Title
Proceedings of the Satellite symposium to ESSDERC 95, the Hague, the Netherlands ALTECH 95--analytical techniques for semiconductor materials and process characterization II edited by Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer ; Electronics and Dielectric Science and Technology Divisions [Electrochemical Society, Inc.]
Status
Published
on 14 Jun 2007
Year of Creation
1995
Copyright Claimant
Electrochemical Society, Inc. (employer for hire)
Registration Number
TX0004412954
on 14 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0004412954) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Proceedings of the Satellite symposium to ESSDERC 95, the Hague, the Netherlands ALTECH 95--analytical techniques for semiconductor materials and process characterization II edited by Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer ; Electronics and Dielectric Science and Technology Divisions [Electrochemical Society, Inc.]" created in 1995. The copyright holder is Electrochemical Society, Inc. (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Electrochemical Society, Inc. (employer for hire).
Application Details
Registration Number
TX0004412954
Registration Date
6/14/2007
Year of Creation
1995
Place of First Publication
Pennington, NJ
Publisher Name
Electrochemical Society
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Electrochemical Society, Inc. Electronics Division Electrochemical Society, Inc. Dielectric Science and Technology Division Electrochemical Society, Inc
Physical Description
366 p
Series Statement
Proceedings vol. 95-30
Corporate Authors
Notes
Local Copyright Note: C.O. correspondence
Bibliographic Note: Add ti.: Analytical techniques for semiconductor materials and process characterization II
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