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Copyright Title
Analytical and diagnostic techniques for semiconductor materials, devices, and processes joint proceedings of the symposia on ALTECH 2003, analytical techniques for semiconductor materials and process characterization IV, Paris, France and The 202nd meeting of The Electrochemical Society, diagnostic techniques for semiconductor materials and devices VI, Salt Lake City, Utah editors, Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer ... [et al.]
Status
Published
on 15 Jun 2007
Year of Creation
2003
Copyright Claimant
Electrochemical Society, Inc. (employer for hire)
Registration Number
TX0005771497
on 15 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0005771497) dated 15 Jun 2007, pertains to an electronic file (eService) titled "Analytical and diagnostic techniques for semiconductor materials, devices, and processes joint proceedings of the symposia on ALTECH 2003, analytical techniques for semiconductor materials and process characterization IV, Paris, France and The 202nd meeting of The Electrochemical Society, diagnostic techniques for semiconductor materials and devices VI, Salt Lake City, Utah editors, Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer ... [et al.]" created in 2003. The copyright holder is Electrochemical Society, Inc. (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Electrochemical Society, Inc. (employer for hire).
Application Details
Registration Number
TX0005771497
Registration Date
6/15/2007
Year of Creation
2003
Place of First Publication
Pennington, NJ
Publisher Name
International Society for Optical Engineering
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Electrochemical Society, Inc
Physical Description
556 p
Series Statement
ECS PV 2003-03 SPIE vol. 5133
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