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Statistical modeling of MOSFETs and interconnects for deep-submicron technologies
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Copyright Title

Statistical modeling of MOSFETs and interconnects for deep-submicron technologies

Status

Published

on 14 Jun 2007
Year of Creation
1998
Copyright Claimant
James Chieh-tsung Chen
Registration Number
TX0004898366
on 14 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0004898366) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Statistical modeling of MOSFETs and interconnects for deep-submicron technologies" created in 1998. The copyright holder is James Chieh-tsung Chen, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to James Chieh-tsung Chen.

Copyright Details


Copyright Claimant
James Chieh-tsung Chen

Application Details


Registration Number
TX0004898366
Registration Date
6/14/2007
Year of Creation
1998
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Computer text data

Personal Authors


Notes


Rights Note: Rights and permissions info. on CORDS appl. in CO
Bibliographic Note: Electronic registration

Statements


Author Statement: entire text: James Chieh-tsung Chen
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