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Electron beam induced conductivity effect of polymer resists and charging induced electron beam deflection simulation in electron beam lithography
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Copyright Title

Electron beam induced conductivity effect of polymer resists and charging induced electron beam deflection simulation in electron beam lithography

Status

Published

on 14 Jun 2007
Year of Creation
2000
Copyright Claimant
Justin Jia-jen Hwu
Registration Number
TX0005244404
on 14 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0005244404) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Electron beam induced conductivity effect of polymer resists and charging induced electron beam deflection simulation in electron beam lithography" created in 2000. The copyright holder is Justin Jia-jen Hwu, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Justin Jia-jen Hwu.

Copyright Details


Copyright Claimant
Justin Jia-jen Hwu

Application Details


Registration Number
TX0005244404
Registration Date
6/14/2007
Year of Creation
2000
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Computer text data

Personal Authors


Notes


Rights Note: Rights and permissions info. on CORDS appl. in CO
Bibliographic Note: Electronic registration

Statements


Author Statement: entire text: Justin Jia-jen Hwu
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