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Electron Crystallography for Materials Research and Quantitative Characterization of Nanostructured Materials [Published: 2009-10-07. Issue: vol. 1184, 2009]
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Copyright Title

Electron Crystallography for Materials Research and Quantitative Characterization of Nanostructured Materials [Published: 2009-10-07. Issue: vol. 1184, 2009]

Status

Published

on 4 Dec 2009
Year of Creation
2009
Copyright Claimant
Materials Research Society
Registration Number
TX0007110455
on 4 Dec 2009

Copyright Summary


The U.S. Copyright record (Registration Number: TX0007110455) dated 4 Dec 2009, pertains to an electronic file (eService) titled "Electron Crystallography for Materials Research and Quantitative Characterization of Nanostructured Materials [Published: 2009-10-07. Issue: vol. 1184, 2009]" created in 2009. The copyright holder is Materials Research Society, known for their creative contributions in serial registration. For any inquiries concerning this copyrighted material, kindly reach out to Materials Research Society.

Copyright Details


Copyright Claimant
Materials Research Society

Application Details


Registration Number
TX0007110455
Registration Date
12/4/2009
Year of Creation
2009
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Materials Research Society
First Publication Nation
United States
ISSN
0272-9172

Notes


Copyright Local Holdings: vol. 1184, 2009 Created Not given Pub. 2009-10-07 Reg. 2009-10-26 TX0007110455 MWEL

Statements


Application Title Statement: Electron Crystallography for Materials Research and Quantitative Characterization of Nanostructured Materials
Author Statement: Materials Research Society employer for hire Authorship: Collective Work
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