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Reliability study of Zr and Al incorporated Hf based high-k dielectric deposited by advanced processing
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Copyright Title

Reliability study of Zr and Al incorporated Hf based high-k dielectric deposited by advanced processing

Status

Published

on 17 Oct 2016
Year of Creation
2015
Copyright Claimant
Md Nasir Uddin Bhuyian
Registration Number
TX0008277882
on 17 Oct 2016

Copyright Summary


The U.S. Copyright record (Registration Number: TX0008277882) dated 17 Oct 2016, pertains to an electronic file (eService) titled "Reliability study of Zr and Al incorporated Hf based high-k dielectric deposited by advanced processing" created in 2015. The copyright holder is Md Nasir Uddin Bhuyian, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Md Nasir Uddin Bhuyian.

Copyright Details


Copyright Claimant
Md Nasir Uddin Bhuyian

Application Details


Registration Number
TX0008277882
Registration Date
10/17/2016
Year of Creation
2015
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Electronic file (eService)
First Publication Nation
United States

Personal Authors


Notes


Rights Note: Diana G Zajic, ProQuest-CSA, LLC, 789 E. Eisenhower Parkway, Ann Arbor, MI, 48108-3218, United States, (800) 521-0600 xext77020, disspub@proquest.com

Statements


Application Title Statement: Reliability study of Zr and Al incorporated Hf based high-k dielectric deposited by advanced processing
Author Statement: Md Nasir Uddin Bhuyian Citizenship: not known Authorship: text
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