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Titanium nitride/hafnium dioxide/silicon dioxide/silicon gate stacks reliability: Contribution of hafnium dioxide and interfacial silicon dioxide layer
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Copyright Title

Titanium nitride/hafnium dioxide/silicon dioxide/silicon gate stacks reliability: Contribution of hafnium dioxide and interfacial silicon dioxide layer

Status

Published

on 22 Feb 2012
Year of Creation
2011
Copyright Claimant
Nilufa Rahim
Registration Number
TX0006738074
on 22 Feb 2012

Copyright Summary


The U.S. Copyright record (Registration Number: TX0006738074) dated 22 Feb 2012, pertains to an electronic file (eService) titled "Titanium nitride/hafnium dioxide/silicon dioxide/silicon gate stacks reliability: Contribution of hafnium dioxide and interfacial silicon dioxide layer" created in 2011. The copyright holder is Nilufa Rahim, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Nilufa Rahim.

Copyright Details


Copyright Claimant
Nilufa Rahim

Application Details


Registration Number
TX0006738074
Registration Date
2/22/2012
Year of Creation
2011
Agency Marc Code
DLC-CO
Record Status
New
Physical Description
Computer text data

Personal Authors


Notes


Rights Note: Rights and permissions info. on CORDS appl. in CO
Local Copyright Note: Electronic registration

Statements


Author Statement: entire text: Nilufa Rahim
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