2014

Silicon design solutions: 6T bit cell test structures (cell char blocks). TXu1802817

Recorded Documents

Silicon design solutions: 6T bit cell test structures (cell char blocks). TXu1802817

Registration Number

V3627D872

on 6 Oct 2014

The U.S. Copyright record (Recordation Number: V3627D872) dated 6 Oct 2014, pertains to an electronic file (eService) titled "Silicon design solutions: 6T bit cell test structures (cell char blocks). TXu1802817" created in 0. The copyright holder is , known for their creative contributions in recorded documents. For any inquiries concerning this copyrighted material, kindly reach out to .

Names Involved

32Mb-radiation-hardened single-port SRAM design review I & 5 other titles

V 00362787200000

Application Details

Registration Number

V3627D872

Registration Date

10/6/2014

Agency Marc Code

DLC-CO

Record Status

New

Personal Authors

32Mb-radiation-hardened single-port SRAM design review I & 5 other titles

V 00362787200000

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