2015

Silicon design solutions: 6T bit cell test structures (cell char blocks) TXu1802817

Recorded Documents

Silicon design solutions: 6T bit cell test structures (cell char blocks) TXu1802817

Registration Number

V3627D520

on 20 Nov 2015

The U.S. Copyright record (Recordation Number: V3627D520) dated 20 Nov 2015, pertains to an electronic file (eService) titled "Silicon design solutions: 6T bit cell test structures (cell char blocks) TXu1802817" created in 0. The copyright holder is , known for their creative contributions in recorded documents. For any inquiries concerning this copyrighted material, kindly reach out to .

Names Involved

32Mb - radiation-hardened single-port SRAM design review I & 5 other titles

V 00362752000000

Application Details

Registration Number

V3627D520

Registration Date

11/20/2015

Agency Marc Code

DLC-CO

Record Status

New

Personal Authors

32Mb - radiation-hardened single-port SRAM design review I & 5 other titles

V 00362752000000

Get your copyright registered todayThousands have copyrighted their assets.
What are you waiting for?

Show terms & conditions

Disclaimer: The information contained in this website is provided for informational purposes only, and should not be construed as legal advice. Although LegalForce RAPC Worldwide P.C., dba Trademarkia P.C., is a law firm (the “Firm”), your use of this website does not establish an attorney-client relationship with the Firm. Such a relationship can only be established after the Firm decides that it is willing and able to accept the engagement after a conflict check and after a written retainer agreement is agreed upon between you and the Firm. Your use of this website is also subject to our Terms of Use and Privacy Policy. ** The entry level subscription is a bundled price which requires a minimum of two billing cycles, or 6 months.