2015

Direct measure of band edge optical absorption of silicon nanostructures using photothermal deflection spectroscopy

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Direct measure of band edge optical absorption of silicon nanostructures using photothermal deflection spectroscopy

Status

Published

on 27 Oct 2015

Year of Creation

2015

San Theingi

Registration Number

TX0008114791

on 27 Oct 2015

The U.S. Copyright record (Registration Number: TX0008114791) dated 27 Oct 2015, pertains to an electronic file (eService) titled "Direct measure of band edge optical absorption of silicon nanostructures using photothermal deflection spectroscopy" created in 2015. The copyright holder is San Theingi, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to San Theingi.

San Theingi

Application Details

Registration Number

TX0008114791

Registration Date

10/27/2015

Year of Creation

2015

Agency Marc Code

DLC-CO

Record Status

New

Physical Description

Electronic file (eService)

First Publication Nation

United States

Personal Authors

San Theingi

Notes

Rights Note: Diana G Zajic, ProQuest-CSA, LLC, 789 E. Eisenhower Parkway, Ann Arbor, MI, 48108-3218, United States, (800) 521-0600 xext77020, disspub@proquest.com

Statements

Application Title Statement: Direct measure of band edge optical absorption of silicon nanostructures using photothermal deflection spectroscopy

Author Statement: San Theingi Citizenship: not known Authorship: text

Notes

Rights Note: Diana G Zajic, ProQuest-CSA, LLC, 789 E. Eisenhower Parkway, Ann Arbor, MI, 48108-3218, United States, (800) 521-0600 xext77020, disspub@proquest.com

Statements

Application Title Statement: Direct measure of band edge optical absorption of silicon nanostructures using photothermal deflection spectroscopy

Author Statement: San Theingi Citizenship: not known Authorship: text

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