2007

Optical characterization techniques for high-performance microelectronic device manufacturing II 25-26 October 1995, Austin, Texas : proceedings John K. Lowell, Ray T. Chen, Jagdish P. Mathur, chairs/editors

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Optical characterization techniques for high-performance microelectronic device manufacturing II 25-26 October 1995, Austin, Texas : proceedings John K. Lowell, Ray T. Chen, Jagdish P. Mathur, chairs/editors

Status

Published

on 14 Jun 2007

Year of Creation

1995

Society of Photo-Optical Instrumentation Engineers (employer for hire)

Registration Number

TX0004371506

on 14 Jun 2007

The U.S. Copyright record (Registration Number: TX0004371506) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Optical characterization techniques for high-performance microelectronic device manufacturing II 25-26 October 1995, Austin, Texas : proceedings John K. Lowell, Ray T. Chen, Jagdish P. Mathur, chairs/editors" created in 1995. The copyright holder is Society of Photo-Optical Instrumentation Engineers (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Society of Photo-Optical Instrumentation Engineers (employer for hire).

Society of Photo-Optical Instrumentation Engineers (employer for hire)

Application Details

Registration Number

TX0004371506

Registration Date

6/14/2007

Year of Creation

1995

Agency Marc Code

DLC-CO

Record Status

New

Corporate Author

Society of Photo-Optical Instrumentation Engineers

Physical Description

302 p

Series Statement

SPIE proceedings series vol. 2638

Personal Authors

John K Lowell

Ray T Chen

Jagdish P Mathur

Corporate Authors

Society of Photo-Optical Instrumentation Engineers

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