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Copyright Title
Analytical and diagnostic techniques for semiconductor materials, devices, and processes joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium, The Electrochemical Society symposium on diagnostic techniques for semiconductor materials and devices editors, Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer ... [et al.]
Status
Published
on 14 Jun 2007
Year of Creation
1999
Copyright Claimant
Society of Photo-Optical Instrumentation Engineers (employer for hire)
Registration Number
TX0005063795
on 14 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0005063795) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Analytical and diagnostic techniques for semiconductor materials, devices, and processes joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium, The Electrochemical Society symposium on diagnostic techniques for semiconductor materials and devices editors, Bernd O. Kolbesen, Cor Claeys, Peter Stallhofer ... [et al.]" created in 1999. The copyright holder is Society of Photo-Optical Instrumentation Engineers (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Society of Photo-Optical Instrumentation Engineers (employer for hire).
Copyright Details
Copyright Claimant
Society of Photo-Optical Instrumentation Engineers (employer for hire)
Application Details
Registration Number
TX0005063795
Registration Date
6/14/2007
Year of Creation
1999
Place of First Publication
Pennington, NJ
Publisher Name
Electrochemical Society
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Society of Photo-Optical Instrumentation Engineers
Physical Description
552 p
Series Statement
ECS PV 99-16 SPIE vol. 3895
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