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Testing, reliability, and application of micro- and nano-material systems II 15-17 Mar. 2004, San Diego, California, USA Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors
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Copyright Title

Testing, reliability, and application of micro- and nano-material systems II 15-17 Mar. 2004, San Diego, California, USA Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors

Status

Published

on 15 Jun 2007
Year of Creation
2004
Registration Number
TX0006024903
on 15 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0006024903) dated 15 Jun 2007, pertains to an electronic file (eService) titled "Testing, reliability, and application of micro- and nano-material systems II 15-17 Mar. 2004, San Diego, California, USA Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors" created in 2004. The copyright holder is Society of Photo-Optical Instrumentation Engineers (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Society of Photo-Optical Instrumentation Engineers (employer for hire).

Application Details


Registration Number
TX0006024903
Registration Date
6/15/2007
Year of Creation
2004
Place of First Publication
Bellingham, WA
Publisher Name
SPIE
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Society of Photo-Optical Instrumentation Engineers
Physical Description
272 p
Series Statement
SPIE proceedings series vol. 5392
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