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Testing, reliability, and application of micro- and nano-material systems III 8-10 March 2005, San Diego, California, USA Robert E. Geer, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors
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Copyright Title

Testing, reliability, and application of micro- and nano-material systems III 8-10 March 2005, San Diego, California, USA Robert E. Geer, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors

Status

Published

on 15 Jun 2007
Year of Creation
2005
Registration Number
TX0006193155
on 15 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0006193155) dated 15 Jun 2007, pertains to an electronic file (eService) titled "Testing, reliability, and application of micro- and nano-material systems III 8-10 March 2005, San Diego, California, USA Robert E. Geer, Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors" created in 2005. The copyright holder is Society of Photo Optical Instrumentation Engineers (employer for hire), known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Society of Photo Optical Instrumentation Engineers (employer for hire).

Application Details


Registration Number
TX0006193155
Registration Date
6/15/2007
Year of Creation
2005
Place of First Publication
Bellingham, WA
Publisher Name
SPIE
Agency Marc Code
DLC-CO
Record Status
Changed
Corporate Author
Society of Photo Optical Instrumentation Engineers
Physical Description
168 p
Series Statement
SPIE vol. 5766
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