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Copyright Title
Analytical techniques for semiconductor materials and process characterization proceedings of the Satellite Symposium to ESSDERC 89 Berlin : proceedings v. 90-11 edited by Bernd O. Kolbesen, Daniel V. McCaughan, Wilfried Vandervorst
Status
Published
on 14 Jun 2007
Year of Creation
1990
Copyright Claimant
the Electrochemical Society, Inc
Registration Number
TX0003003260
on 14 Jun 2007Copyright Summary
The U.S. Copyright record (Registration Number: TX0003003260) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Analytical techniques for semiconductor materials and process characterization proceedings of the Satellite Symposium to ESSDERC 89 Berlin : proceedings v. 90-11 edited by Bernd O. Kolbesen, Daniel V. McCaughan, Wilfried Vandervorst" created in 1990. The copyright holder is The Electrochemical Society, Inc, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to The Electrochemical Society, Inc.
Application Details
Registration Number
TX0003003260
Registration Date
6/14/2007
Year of Creation
1990
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Electrochemical Society, Inc Symposium on Analytical Techniques for Semiconductor Materials and Process Characterization, Berlin, 1989
Physical Description
1 v
Corporate Authors
Notes
Bibliographic Note: Symposium on Analytical Techniques for Semiconductor Materials and Process Characterization held in Berlin, Sept. 15, 1989
Statements
Author Statement: the Electrochemical Society, Inc., employer for hire
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