HomeOwner Search
2007
Category Search
Analytical techniques for semiconductor materials and process characterization proceedings of the Satellite Symposium to ESSDERC 89 Berlin : proceedings v. 90-11 edited by Bernd O. Kolbesen, Daniel V. McCaughan, Wilfried Vandervorst
Visit USCO
hero image
Text Registration
Copyright Title

Analytical techniques for semiconductor materials and process characterization proceedings of the Satellite Symposium to ESSDERC 89 Berlin : proceedings v. 90-11 edited by Bernd O. Kolbesen, Daniel V. McCaughan, Wilfried Vandervorst

Status

Published

on 14 Jun 2007
Year of Creation
1990
Registration Number
TX0003003260
on 14 Jun 2007

Copyright Summary


The U.S. Copyright record (Registration Number: TX0003003260) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Analytical techniques for semiconductor materials and process characterization proceedings of the Satellite Symposium to ESSDERC 89 Berlin : proceedings v. 90-11 edited by Bernd O. Kolbesen, Daniel V. McCaughan, Wilfried Vandervorst" created in 1990. The copyright holder is The Electrochemical Society, Inc, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to The Electrochemical Society, Inc.

Copyright Details


Application Details


Registration Number
TX0003003260
Registration Date
6/14/2007
Year of Creation
1990
Agency Marc Code
DLC-CO
Record Status
New
Corporate Author
Electrochemical Society, Inc Symposium on Analytical Techniques for Semiconductor Materials and Process Characterization, Berlin, 1989
Physical Description
1 v

Notes


Bibliographic Note: Symposium on Analytical Techniques for Semiconductor Materials and Process Characterization held in Berlin, Sept. 15, 1989

Statements


Author Statement: the Electrochemical Society, Inc., employer for hire
Get your copyright registered todayThousands have copyrighted their assets.
What are you waiting for?

© 2023 reserved by Trademarkia
Show terms & conditions