Layout and logic techniques for yield and reliability enhancement

Status

Published

on 14 Jun 2007

Year of Creation

1998

Zhan Chen

Registration Number

TX0004941515

on 14 Jun 2007

The U.S. Copyright record (Registration Number: TX0004941515) dated 14 Jun 2007, pertains to an electronic file (eService) titled "Layout and logic techniques for yield and reliability enhancement" created in 1998. The copyright holder is Zhan Chen, known for their creative contributions in text registration. For any inquiries concerning this copyrighted material, kindly reach out to Zhan Chen.

Zhan Chen

Application Details

Registration Number

TX0004941515

Registration Date

6/14/2007

Year of Creation

1998

Agency Marc Code

DLC-CO

Record Status

New

Physical Description

Microfiche

Personal Authors

Zhan Chen

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